In this paper, we present research on thermal transition temperature determination in poly (3-hexylthiophene-2,5-diyl) (P3HT), [6,6]-phenyl-C61-butyric acid methyl ester (PC60BM), and their blends, which are materials that are conventionally used in organic optoelectronics. Here, for the first time the results of electrical resistance measurements are explored to detect thermal transitions temperatures, such as glass transition Tg and cold crystallization Tcc of the film. To confirm these results, the variable-temperature spectroscopic ellipsometry studies of the same samples were performed. The thermal transitions temperatures obtained with electrical measurements are well suited to phase diagram, constructed on the basis of ellipsometry in our previous work. The data presented here prove that electrical resistance measurements alone are sufficient for qualitative thermal analysis, which lead to the identification of characteristic temperatures in P3HT:PC60BM films. Based on the carried studies, it can be expected that the determination of thermal transition temperatures by means of electrical resistance measurements will also apply to other semi-conducting polymer films.
Keywords: electrical resistance; ellipsometric modeling; organic semiconductors; polymer films; spectroscopic ellipsometry.