Data related to spectrum analyzes for phases identification, microstructure and mechanical properties of additive manufactured Ti6Al4V reinforced with nano Yttria stabilized zirconia

Amine Hattal; Thierry Chauveau; Madjid Djemai; Jean Jacques Fouchet; Brigitte Bacroix; Guy Dirras

doi:10.1016/j.dib.2020.105249

Data related to spectrum analyzes for phases identification, microstructure and mechanical properties of additive manufactured Ti6Al4V reinforced with nano Yttria stabilized zirconia

Data Brief. 2020 Feb 6:29:105249. doi: 10.1016/j.dib.2020.105249. eCollection 2020 Apr.

Authors

Amine Hattal^{1

2}, Thierry Chauveau¹, Madjid Djemai², Jean Jacques Fouchet², Brigitte Bacroix¹, Guy Dirras¹

Affiliations

¹ LSPM - CNRS, Université Paris 13, 99 avenue Jean Baptiste Clément, 932430, Villetaneuse, France.
² Z3Dlab, Parc Technologique, 26 Rue des Sablons, Montmagny 95360, France.

Abstract

Ti6Al4V reinforced by nano yttria-stabilized zirconia (nYSZ) addition parts were manufactured via selective laser additive manufacturing. A research paper entitled "Effect of nano-yttria stabilized zirconia addition on the microstructure and mechanical properties of Ti6Al4V parts manufactured by selective laser melting" [1] discuss the microstructure and mechanical properties relationships. This data paper presents the analytical elements used to perform Rietveld refinement using X-ray diffraction data (XRD) obtained on manufactured parts in order to uncover microstructure characteristics (phase, crystallographic texture, lattice parameters, crystallite size, etc.). The XRD data are complemented by grains size/shape estimation and description obtained by Electron Backscattered Diffraction (EBSD).

Keywords: Additive manufacturing; Crystallographic texture; EBSD; Selective laser melting; Ti6Al4V; XRD.