In order to solve the low-sensitivity problem of the dielectric constant with the resonant cavity method, a sensor based on a substrate-integrated waveguide structure loaded with a multi-complementary open resonant ring is proposed. With the enhanced resonance characteristics of the sensor, this design realized the measurement of complex dielectric constants in a wide range. The frequency selectivity of the sensor is improved by the high-quality factor of the substrate-integrated waveguide. By loading three complementary resonant rings with different opening directions in the ground plane, a deeper notch and better out-of-band suppression are achieved. The effect of the complex dielectric constant on both resonant frequency and quality factor is discussed by calculating the material under test with a known dielectric constant. Simulation and experimental results show that a resonance frequency offset of 102 MHz for the per unit dielectric constant is achieved. A wide frequency offset is the prerequisite for accurate measurement. The measurement results of four plates match well with the standard values, with a relative error of the real part of the dielectric constant of less than 2% and an error of less than 0.0099 for the imaginary part.
Keywords: cavity; complementary open resonant ring; dielectric constant; sensor; substrate-integrated waveguide.