An intrinsic exciton dephasing is the coherence loss of exciton dipole oscillation, while the total exciton dephasing originates from coherence loss due to exciton-exciton interaction and excitonphonon coupling. In this article, the total exciton dephasing time of tungsten diselenide (WSe₂) atomic layers was analyzed as functions of excitation intensity with exciton-exciton coupling strength and temperature with exciton-phonon coupling strength. It was hypothesized that the total exciton dephasing time is shortened as the exciton-exciton interaction and the exciton-phonon coupling are increased. The coherence loss analysis revealed that the exciton dephasing time of WSe₂ atomic layers is due to mainly the temperature rather than the excitation intensity.