This paper aims to employ the numerical simulations to assess the risk of cellular damage during the application of a novel paradigm of electrical stimulation mapping (ESM) used in neurosurgery. The core principle of the paradigm is the use of short, high-intensity and high-frequency stimulation pulses. We developed a complex numerical model and performed coupled electro-thermal transient simulations. The model was optimized by incorporating ESM electrodes' resistance obtained during multiple intraoperative measurements and validated by comparing them with the results of temperature distribution measurement acquired by thermal imaging. The risk of heat-induced cellular damage was assessed by applying the Arrhenius equation integral on the computed time-dependent spatial distribution of temperature in the brain tissue. Our results suggest that the impact of the temperature increase during our novel ESM paradigm is thermally non-destructive. The presented simulation results match the previously published thermographic measurement and histopathological examination of the stimulated brain tissue and confirm the safety of the novel ESM.