We report in situ observation of dynamic pitch jumps in cholesteric liquid crystal (CLC) layers that depend on the applied electric field. A high-speed and wide bandwidth wavelength-swept laser is used as an optical broadband source to measure the dynamic pitch jumps. We could not observe the dynamic pitch jump in the quasi-static pitch variation. Instead, we carry out two driving methods, a normal driving and an overdriving method, in order to measure the dynamic pitch jump in the CLC cell. For the case of normal driving, it has been confirmed that the reflection band from the measurement region is discontinuously shifted by movement of the defect wall. The reflection band was compressed and recovered before the band moved, but the dynamic pitch jump of the helix could not be observed. For the case of overdriving, however, it was possible to observe the unwinding of the helix during the dynamic pitch jump. The entire dynamic pitch jump process in the CLC cell could be observed by measuring the transmission spectra from the CLC cell by varying the applied electric field. We confirm that the entire reaction time with the overdriving method was about 800 ms, which was shorter than with the normal driving method. This study contributes to the development of fast in-plane switching research and the development of new CLC devices.