High dose efficiency atomic resolution imaging via electron ptychography

Timothy J Pennycook; Gerardo T Martinez; Peter D Nellist; Jannik C Meyer

doi:10.1016/j.ultramic.2018.10.005

High dose efficiency atomic resolution imaging via electron ptychography

Ultramicroscopy. 2019 Jan:196:131-135. doi: 10.1016/j.ultramic.2018.10.005. Epub 2018 Oct 18.

Authors

Timothy J Pennycook¹, Gerardo T Martinez², Peter D Nellist², Jannik C Meyer³

Affiliations

¹ Faculty of Physics, University of Vienna, Boltzmanngasse 5, Vienna 1090, Austria; Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstrasse 1, Stuttgart 70569, Germany. Electronic address: t.pennycook@fkf.mpg.de.
² Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
³ Faculty of Physics, University of Vienna, Boltzmanngasse 5, Vienna 1090, Austria.

PMID: 30366318
DOI: 10.1016/j.ultramic.2018.10.005

Abstract

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset.

Keywords: Dose efficiency; Phase contrast; Ptychography; STEM; TEM.

Publication types

Research Support, Non-U.S. Gov't