Tetrathiafulvaleno-Annelated Porphyrins

Jan Becher; Thomas Brimert; Jan O Jeppesen; Jens Z Pedersen; Roman Zubarev; Thomas Bjørnholm; Niels Reitzel; Torben R Jensen; Kristian Kjaer; Eric Levillain

doi:10.1002/1521-3773(20010702)40:13<2497::AID-ANIE2497>3.0.CO;2-F

Tetrathiafulvaleno-Annelated Porphyrins

Angew Chem Int Ed Engl. 2001 Jul 2;40(13):2497-2500. doi: 10.1002/1521-3773(20010702)40:13<2497::AID-ANIE2497>3.0.CO;2-F.

Authors

Affiliations

¹ Department of Chemistry Odense University (University of Southern Denmark) Campusvej 55, 5230, Odense M (Denmark) Fax: (+45) 66-15-87-80.
² Nano-Science Center, Department of Chemistry University of Copenhagen Universitetsparken 5, 2100, Copenhagen Ø (Denmark).
³ Condensed Matter Physics and Chemistry Department Risø National Laboratory Building 108, Post Office Box 49, 4000 Roskilde (Denmark).
⁴ Ingénierie Moléculaire et Matériaux Organiques CNRS UMR 6501, Université d'Angers, 49045 Angers (France).

PMID: 29712278
DOI: 10.1002/1521-3773(20010702)40:13<2497::AID-ANIE2497>3.0.CO;2-F

Abstract

Two efficient synthetic routes to the first tetrathiafulvaleno-annelated porphyrins are reported. These novel porphyrin systems (see picture; Pe=pentyl) have been characterized by using a variety of techniques including EPR spectroscopy, cyclic voltammetry, and mass spectrometry. Langmuir-Blodgett films obtained from the porphyrins were used to carry out structural studies by using X-ray diffraction and atomic force microscopy.

Keywords: EPR spectroscopy; Langmuir-Blodgett films; cyclic voltammetry; porphyrinoids; tetrathiafulvalenes.