(Multi)functional Atomic Force Microscopy Imaging

Annu Rev Anal Chem (Palo Alto Calif). 2018 Jun 12;11(1):329-350. doi: 10.1146/annurev-anchem-061417-125716. Epub 2018 Feb 28.

Abstract

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

Keywords: AFM probe modification; atomic force microscopy–scanning electrochemical microscopy; molecular recognition imaging; multiparametric AFM.

Publication types

  • Research Support, Non-U.S. Gov't