Exploring the interior of cuticles and compressions of fossil plants by FIB-SEM milling and image microscopy

J Microsc. 2018 Jan;269(1):48-58. doi: 10.1111/jmi.12607. Epub 2017 Jul 26.

Abstract

We present the first study of cuticles and compressions of fossil leaves by Focused Ion Beam Scanning Electron Microscopy (FIB-SEM). Cavities preserved inside fossil leaf compressions corresponding to substomatal chambers have been observed for the first time and several new features were identified in the cross-section cuts. These results open a new way in the investigation of the three-dimensional structures of both micro- and nanostructural features of fossil plants. Moreover, the application of the FIB-SEM technique to both fossils and extant plant remains represent a new source of taxonomical, palaeoenvironmental and palaeoclimatic information.

Keywords: FIB; SEM; fossil plant compressions; fossil plant cuticle; microstructures; ultrastructures.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Fossils / ultrastructure*
  • Imaging, Three-Dimensional
  • Ions*
  • Microscopy, Electron, Scanning / methods*
  • Plant Leaves / ultrastructure*

Substances

  • Ions