Introduction to the special issue on high-resolution X-ray diffraction and imaging

Virginie Chamard; Václav Holý

doi:10.1107/S1600576717007257

Introduction to the special issue on high-resolution X-ray diffraction and imaging

J Appl Crystallogr. 2017 Jun 1;50(Pt 3):671-672. doi: 10.1107/S1600576717007257.

Authors

Virginie Chamard¹, Václav Holý²

Affiliations

¹ Aix-Marseille Univ, CNRS, Centrale Marseille, Institut Fresnel, Marseille, France.
² Department of Condensed Matter Physics, Charles University, Prague, Czech Republic.

Abstract

The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016.

Keywords: editorial; high-resolution X-ray diffraction; imaging.

Publication types

Editorial