A graphic approach to the analysis of a large X-ray microanalysis dataset obtained via SEM-EDS

N Yu Parkhimovich; A R Salikhov; M F Imayev

doi:10.1002/jemt.22897

A graphic approach to the analysis of a large X-ray microanalysis dataset obtained via SEM-EDS

Microsc Res Tech. 2017 Sep;80(9):1028-1035. doi: 10.1002/jemt.22897. Epub 2017 May 27.

Authors

N Yu Parkhimovich¹, A R Salikhov², M F Imayev^{1

3}

Affiliations

¹ Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, 450001, Russia.
² Ufa State Aviation Technical University, Ufa, 450000, Russia.
³ Bashkir State University, Ufa, 450076, Russia.

PMID: 28556587
DOI: 10.1002/jemt.22897

Abstract

A graphical method for phase analysis of advanced materials by EDS-SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X-ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations.

Keywords: (Bi; Pb)2Sr2Ca2Cu3O10+d; X-ray microanalysis; advanced materials; graphic method; particle identification; phase composition.