The magnetic properties of some single molecule magnets (SMM) on surfaces can be strongly modified by the molecular packing in nanometric films/aggregates or by interactions with the substrate, which affect the molecular orientation and geometry. Detailed investigations of the magnetism of thin SMM films and nanostructures are necessary for the development of spin-based molecular devices, however this task is challenged by the limited sensitivity of laboratory-based magnetometric techniques and often requires access to synchrotron light sources to perform surface sensitive X-ray magnetic circular dichroism (XMCD) investigations. Here we show that low-temperature magnetic force microscopy is an alternative powerful laboratory tool able to extract the field dependence of the magnetization and to identify areas of in-plane and perpendicular magnetic anisotropy in microarrays of the SMM terbium(III) bis-phthalocyaninato (TbPc2) neutral complex grown as nanosized films on SiO2 and perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA), and this is in agreement with data extracted from nonlocal XMCD measurements performed on homogeneous TbPc2/PTCDA films.
Keywords: Magnetic force microscopy; dipolar field; magnetic anisotropy; molecular magnetism; patterning; terbium double decker.