In this paper, several configurations of splitter/combiner microstrip sections loaded with stepped impedance resonators (SIRs) are analyzed. Such structures are useful as sensors and comparators, and the main aim of the paper is to show that the proposed configurations are useful for the optimization of sensitivity and discrimination. Specifically, for comparison purposes, i.e., to determine anomalies, abnormalities or defects of a sample under test (SUT) in comparison to a reference sample, it is shown that up to three samples can be simultaneously tested. Simple models of the proposed structures are presented, and these models are validated through electromagnetic simulation and experiment. Finally, the principle of operation is validated through a proof-of-concept demonstrator.
Keywords: differential sensors; microstrip technology; microwave sensors; stepped impedance resonator (SIR).