A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

P M Nilson; F Ehrne; C Mileham; D Mastrosimone; R K Jungquist; C Taylor; C R Stillman; S T Ivancic; R Boni; J Hassett; D J Lonobile; R W Kidder; M J Shoup 3rd; A A Solodov; C Stoeckl; W Theobald; D H Froula; K W Hill; L Gao; M Bitter; P Efthimion; D D Meyerhofer

doi:10.1063/1.4961076

A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

Rev Sci Instrum. 2016 Nov;87(11):11D504. doi: 10.1063/1.4961076.

Authors

P M Nilson¹, F Ehrne¹, C Mileham¹, D Mastrosimone¹, R K Jungquist¹, C Taylor¹, C R Stillman¹, S T Ivancic¹, R Boni¹, J Hassett¹, D J Lonobile¹, R W Kidder¹, M J Shoup 3rd¹, A A Solodov¹, C Stoeckl¹, W Theobald¹, D H Froula¹, K W Hill², L Gao², M Bitter², P Efthimion², D D Meyerhofer³

Affiliations

¹ Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299, USA.
² Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543-0451, USA.
³ Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.

PMID: 27910626
DOI: 10.1063/1.4961076

Abstract

A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K_α1 line. To demonstrate the performance of the spectrometer under high-power conditions, K_α1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10¹⁸ W/cm². The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.