Enhanced Piezoelectric Response due to Polarization Rotation in Cobalt-Substituted BiFeO3 Epitaxial Thin Films

Keisuke Shimizu; Hajime Hojo; Yuichi Ikuhara; Masaki Azuma

doi:10.1002/adma.201602450

Enhanced Piezoelectric Response due to Polarization Rotation in Cobalt-Substituted BiFeO₃ Epitaxial Thin Films

Adv Mater. 2016 Oct;28(39):8639-8644. doi: 10.1002/adma.201602450. Epub 2016 Aug 24.

Authors

Keisuke Shimizu¹, Hajime Hojo², Yuichi Ikuhara³, Masaki Azuma⁴

Affiliations

¹ Materials and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8503, Japan.
² Materials and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8503, Japan. hhojo@msl.titech.ac.jp.
³ Institute of Engineering Innovation, University of Tokyo, Yayoi, Bunkyo, 113-8656, Japan.
⁴ Materials and Structures Laboratory, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8503, Japan. mazuma@msl.titech.ac.jp.

PMID: 27554138
DOI: 10.1002/adma.201602450

Abstract

Polarization rotation induced by an external electric field in piezoelectric materials such as PbZr_1-_x Ti_x O₃ is generally regarded as the origin of their large piezoelectric responses. Here, the piezoelectric responses of high-quality cobalt-substituted BiFeO₃ epitaxial thin films with monoclinic distortions are systematically examined. It is demonstrated that polarization rotation plays a crucial role in improving the piezoelectric responses in this material.

Keywords: bismuth ferrite; piezoelectric materials; polarization rotation.