Advanced atomic force microscopy techniques III
Beilstein J Nanotechnol
.
2016 Jul 21:7:1052-4.
doi: 10.3762/bjnano.7.98.
eCollection 2016.
Authors
Thilo Glatzel
1
,
Thomas Schimmel
2
Affiliations
1
Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
2
Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany.
PMID:
27547623
PMCID:
PMC4979673
DOI:
10.3762/bjnano.7.98
No abstract available
Keywords:
atomic force microscopy.