Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose; Jingya Sun; Jafar I Khan; Basamat S Shaheen; Aniruddha Adhikari; Tien Khee Ng; Victor M Burlakov; Manas R Parida; Davide Priante; Alain Goriely; Boon S Ooi; Osman M Bakr; Omar F Mohammed

doi:10.1002/adma.201600202

Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Adv Mater. 2016 Jul;28(25):5106-11. doi: 10.1002/adma.201600202. Epub 2016 Apr 25.

Affiliations

¹ Solar and Photovoltaics Engineering Research Center, Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia.
² Photonics Laboratory, Computer, Electrical, and Mathematical Sciences and Engineering, KAUST, Thuwal, 23955-6900, Kingdom of Saudi Arabia.
³ Mathematical Institute, University of Oxford, Woodstock Road, Oxford, OX2 6GG, UK.

PMID: 27111855
DOI: 10.1002/adma.201600202

Abstract

A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.

Keywords: InGaN; carrier diffusion; carrier dynamics; nanowires; real-space imaging; surface dynamics; ultrafast electron microscopy.