Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors

Yuanyuan Hu; Vincenzo Pecunia; Lang Jiang; Chong-An Di; Xike Gao; Henning Sirringhaus

doi:10.1002/adma.201503812

Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors

Adv Mater. 2016 Jun;28(23):4713-9. doi: 10.1002/adma.201503812. Epub 2016 Apr 5.

Authors

Yuanyuan Hu¹, Vincenzo Pecunia¹, Lang Jiang¹, Chong-An Di², Xike Gao³, Henning Sirringhaus¹

Affiliations

¹ Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
² Beijing National Laboratory for Molecular Sciences Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
³ Laboratory of Materials Science, Shanghai Institute of Organic Chemistry, Chinese Academy of Sciences, Shanghai, 200032, P. R. China.

PMID: 27059526
DOI: 10.1002/adma.201503812

Abstract

A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field-effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF state and in recombination of trapped majority carriers trapped after an ON state is understood.

Keywords: minority carriers; organic transistors; scanning Kelvin probe microscopy.