The intensity of scattered light is extremely sensitive to even small changes of illumination wavelength, incident angle, polarization states, or even the measurement position. To obtain light scattering distributions with varied parameters, time-consuming sequential measurement procedures are typically employed. Here, we propose a concept for the measurement of multiple properties at the same time. This is achieved by tailoring orthogonal frequency division multiplexing (OFDM) for light scattering measurement techniques to the required low inter-channel crosstalk performance. The concept is used for a highly-robust roughness and contamination characterization, to derive one-shot roughness information, as well as to characterize color and appearance.