1 State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. jwq@nwpu.edu.cn zha_gq@nwpu.edu.cn and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China.
2 State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. jwq@nwpu.edu.cn zha_gq@nwpu.edu.cn.
3 National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, P. R. China.
Correction for 'Effects of Ga-Te interface layer on the potential barrier height of CdTe/GaAs heterointerface' by Shouzhi Xi et al., Phys. Chem. Chem. Phys., 2016, 18, 2639-2645.