Closing the gap between electron and X-ray crystallography

Acta Crystallogr B Struct Sci Cryst Eng Mater. 2015 Dec 1;71(Pt 6):737-9. doi: 10.1107/S2052520615022441. Epub 2015 Dec 1.

Abstract

The development of a proper refinement algorithm that takes into account dynamical scattering guarantees, for electron crystallography, results approaching X-rays in terms of precision, accuracy and reliability. The combination of such dynamical refinement and electron diffraction tomography establishes a complete pathway for the structure characterization of single sub-micrometric crystals.

Keywords: dynamical diffraction; electron crystallography; electron diffraction tomography.