Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction

Gert Nolze; Aimo Winkelmann; Alan P Boyle

doi:10.1016/j.ultramic.2015.10.010

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction

Ultramicroscopy. 2016 Jan:160:146-154. doi: 10.1016/j.ultramic.2015.10.010. Epub 2015 Oct 23.

Authors

Gert Nolze¹, Aimo Winkelmann², Alan P Boyle³

Affiliations

¹ Dept 5.1, Federal Institute for Materials, Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany. Electronic address: Gert.Nolze@bam.de.
² Bruker Nano, Am Studio 2D, 12489 Berlin, Germany.
³ Department of Earth, Ocean & Ecological Sciences, Herdman Building, 4 Brownlow Street, University of Liverpool, Liverpool L69 3GP, UK.

PMID: 26517547
DOI: 10.1016/j.ultramic.2015.10.010

Abstract

We demonstrate an approach to overcome Kikuchi pattern misindexing problems caused by crystallographic pseudosymmetry in electron backscatter diffraction (EBSD) measurements. Based on the quantitative comparison of experimentally measured Kikuchi patterns with dynamical electron diffraction simulations, the algorithm identifies the best-fit orientation from a set of pseudosymmetric candidates. Using measurements on framboidal pyrite (FeS2) as an example, we also show the improvement of the orientation precision using this approach.

Keywords: Cross-correlation; EBSD; Hough transformation; Orientation precision; Pattern simulation; Pseudosymmetry; Pyrite.