XTOP: high-resolution X-ray diffraction and imaging

Vincent Favre-Nicolin; José Baruchel; Hubert Renevier; Joël Eymery; András Borbély

doi:10.1107/S160057671500895X

XTOP: high-resolution X-ray diffraction and imaging

J Appl Crystallogr. 2015 May 31;48(Pt 3):620. doi: 10.1107/S160057671500895X. eCollection 2015 Jun 1.

Authors

Vincent Favre-Nicolin¹, José Baruchel², Hubert Renevier³, Joël Eymery¹, András Borbély⁴

Affiliations

¹ Université Grenoble Alpes, INAC-SP2M, F-38000 Grenoble-Alpes, France ; CEA, INAC-SP2M, F-38000 Grenoble, France.
² ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.
³ Laboratoire des Matériaux et du Génie Physique, Grenoble INP - Minatec, Grenoble, France.
⁴ École Nationale Supérieure des Mines, SMS-EMSE, CNRS:UMR 5307, LGF, Saint-Étienne, France.

Abstract

The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.

Keywords: editorial; high-resolution X-ray diffraction; imaging.