A method is proposed for extracting the linear birefringence (LB) and linear dichroism (LD) properties of an anisotropic optical sample using reflection-mode optical coherence tomography (OCT) and a hybrid Mueller matrix formalism. To ensure the accuracy of the extracted parameter values, a method is proposed for calibrating and compensating the polarization distortion effect induced by the beam splitters in the OCT system using a composite quarter-waveplate / half-waveplate / quarter-waveplate structure. The validity of the proposed method is confirmed by extracting the LB and LD properties of a quarter-wave plate and a defective polarizer. To the best of the authors' knowledge, the method proposed in this study represents the first reported attempt to utilize an inverse Mueller matrix formalism and a reflection-mode OCT structure to extract the LB and LD parameters of optically anisotropic samples.