Semiconductor-enhanced Raman scattering for highly robust SERS sensing: the case of phosphate analysis

Chem Commun (Camb). 2015 May 4;51(36):7641-4. doi: 10.1039/c5cc02395e.

Abstract

Quantitative analysis of phosphate anions was achieved by measurement of "turn-off" SERS based on the first-layer effect of a chemical mechanism. More importantly, our results demonstrate that it is possible, by means of semiconductor-enhanced Raman scattering, to enhance the SERS sensing performance including stability and reproducibility.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Particle Size
  • Phosphates / analysis*
  • Semiconductors*
  • Spectrum Analysis, Raman / methods*
  • Surface Properties

Substances

  • Phosphates