In this paper we present the first semiconductor disk laser (SDL) emitting simultaneously two collinearly overlapping cross-polarized gigahertz modelocked pulse trains with different pulse repetition rates. Using only a simple photo detector and a microwave spectrum analyzer directly down-converts the frequency comb difference from the optical to the microwave frequency domain. With this setup, the relative carrier-envelope-offset (CEO) frequency can be accessed directly without an f-to2f interferometer. A very compact design is obtained using the modelocked integrated external-cavity surface emitting laser (MIXSEL) which is part of the family of optically pumped SDLs and similar to a vertical external cavity surface emitting laser (VECSEL) but with both gain and saturable absorber integrated into the same semiconductor wafer (i.e. MIXSEL chip). We then simply added an additional intracavity birefringent crystal inside the linear straight cavity between the output coupler and the MIXSEL chip which splits the cavity beam into two collinear but spatially separated cross-polarized beams on the MIXSEL chip. This results in two modelocked collinear and fully overlapping cross-polarized output beams with adjustable pulse repetition frequencies with excellent noise performance. We stabilized both pulse repetition rates of the dual comb MIXSEL.