NMR spin-lattice relaxation time T(1) of thin films obtained by magnetic resonance force microscopy

Seung-Bo Saun; Soonho Won; Sungmin Kwon; Soonchil Lee

doi:10.1016/j.jmr.2015.02.009

NMR spin-lattice relaxation time T(1) of thin films obtained by magnetic resonance force microscopy

J Magn Reson. 2015 May:254:71-4. doi: 10.1016/j.jmr.2015.02.009. Epub 2015 Mar 7.

Authors

Seung-Bo Saun¹, Soonho Won², Sungmin Kwon¹, Soonchil Lee³

Affiliations

¹ Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea.
² Advanced Metallic Materials Division, Korea Institute of Materials Science, Changwon 642-831, Republic of Korea.
³ Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea. Electronic address: soonchillee@kaist.ac.kr.

PMID: 25828244
DOI: 10.1016/j.jmr.2015.02.009

Abstract

We obtained the NMR spectrum and the spin-lattice relaxation time (T1) for thin film samples by magnetic resonance force microscopy (MRFM). The samples were CaF2 thin films which were 50 nm and 150 nm thick. T1 was measured at 18 K using a cyclic adiabatic inversion method at a fixed frequency. A comparison of the bulk and two thin films showed that T1 becomes shorter as the film thickness decreases. To make the comparison as accurate as possible, all three samples were loaded onto different beams of a multi-cantilever array and measured in the same experimental environment.

Keywords: MRFM; NMR; Spin–lattice relaxation time; Thin film.

Publication types

Research Support, Non-U.S. Gov't