Sub-100 nm resolution microscopy based on proximity projection grating scheme

Feng Hu; Michael G Somekh; Darren J Albutt; Kevin Webb; Emilia Moradi; Chung W See

doi:10.1038/srep08589

Sub-100 nm resolution microscopy based on proximity projection grating scheme

Sci Rep. 2015 Feb 26:5:8589. doi: 10.1038/srep08589.

Authors

Feng Hu¹, Michael G Somekh², Darren J Albutt², Kevin Webb², Emilia Moradi², Chung W See¹

Affiliations

¹ Department of Electrical and Electronic Engineering, University of Nottingham, Nottingham, NG7 2RD, UK.
² Institute of Biophysics, Imaging and Optical Science (IBIOS), University of Nottingham, Nottingham, NG7 2RD, UK.

Abstract

Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Animals
Fluorescent Dyes / chemistry
Image Enhancement*
Limit of Detection
Mice
Microscopy, Fluorescence / instrumentation
Microscopy, Fluorescence / methods
NIH 3T3 Cells

Substances

Fluorescent Dyes