Advanced elemental characterization during Pt-In catalyst formation by wavelet transformed X-ray absorption spectroscopy

Anal Chem. 2015 Mar 17;87(6):3520-6. doi: 10.1021/acs.analchem.5b00109. Epub 2015 Feb 27.

Abstract

Complementary to conventional X-ray absorption near edge structure (XANES) and Fourier transformed (FT) extended X-ray absorption fine structure (EXAFS) analysis, the systematic application of wavelet transformed (WT) XAS is shown to disclose the physicochemical mechanisms governing Pt-In catalyst formation. The simultaneous k- and R-space resolution of the WT XAS signal allows for the efficient allocation of the elemental nature to each R-space peak. Because of its elemental discrimination capacity, the technique delivers structural models which can subsequently serve as an input for quantitative FT EXAFS modeling. The advantages and limitations of applying WT XAS are demonstrated (1) before and (2) after calcination to 650 °C of a Pt(acac)2 impregnated Mg(In)(Al)Ox support and (3) after subsequent H2 reduction to 650 °C. Combined XANES, FT, and WT XAS analysis shows that the acac ligands of the Pt precursor decompose during calcination, leading to atomically dispersed Pt(4+) cations on the Mg(In)(Al)Ox support. H2 reduction treatment eventually results in the formation of 1.5 nm Pt-In alloyed nanoparticles. Widespread use and systematic application of wavelet-based XAS can potentially reveal in greater detail the intricate mechanisms involved in catalysis, chemistry, and related fields.