A device to investigate the delamination strength in laminates at room and cryogenic temperature

Xingyi Zhang; Wei Liu; Jun Zhou; You-He Zhou

doi:10.1063/1.4904736

A device to investigate the delamination strength in laminates at room and cryogenic temperature

Rev Sci Instrum. 2014 Dec;85(12):125115. doi: 10.1063/1.4904736.

Authors

Xingyi Zhang¹, Wei Liu¹, Jun Zhou¹, You-He Zhou¹

Affiliation

¹ Key Laboratory of Mechanics on Disaster and Environment in Western China attached to the Ministry of Education of China, Lanzhou University, Lanzhou, Gansu 730000, People's Republic of China and Department of Mechanics and Engineering Sciences, College of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, Gansu 730000, People's Republic of China.

PMID: 25554334
DOI: 10.1063/1.4904736

Abstract

We construct an instrument to study the behavior of delamination strength in laminates which can be defined as the critical transverse stress at which an actual delamination occurs. The device allows the anvil measurements at room temperature or the liquid nitrogen temperature. For the electro-magnetic laminated materials (e.g., a superconducting YaBa2Cu3O(7-x) coated conductor which has a typical laminated structure), the delamination strength was measured while the properties of transport current were also recorded. Moreover, the influences of external magnetic field on the delamination strength were presented.