Interferometry provides a high degree of accuracy in the measurement of sub-micrometer deformations; however, the noise associated with experimental measurement undermines the integrity of interference fringes. This study proposes the use of standard deviation in the temporal domain to improve the image quality of patterns obtained from temporal speckle pattern interferometry. The proposed method combines the advantages of both mean and subtractive methods to remove background noise and ambient disturbance simultaneously, resulting in high-resolution images of excellent quality. The out-of-plane vibration of a thin piezoelectric plate is the main focus of this study, providing information useful to the development of energy harvesters. First, ten resonant states were measured using the proposed method, and both mode shape and resonant frequency were investigated. We then rebuilt the phase distribution of the first resonant mode based on the clear interference patterns obtained using the proposed method. This revealed instantaneous deformations in the dynamic characteristics of the resonant state. The proposed method also provides a frequency-sweeping function, facilitating its practical application in the precise measurement of resonant frequency. In addition, the mode shapes and resonant frequencies obtained using the proposed method were recorded and compared with results obtained using finite element method and laser Doppler vibrometery, which demonstrated close agreement.