A new type of CMOS compatible photodetector, exhibiting intrinsic light-to-time conversion, is proposed. Its main objective is to start the time-to-digital conversion directly at its output, thereby avoiding the cumbersome analog processing. The operation starts with an internal charge integration, followed by a positive feedback, and a sharp switching-current. The device, consisting of a deeply depleted MOS structure controlling the conduction of a forward-based PN diode, is presented and its operation explained. TCAD simulations are used to show the effects of semiconductor parameters and bias conditions. The photodetector and its detection circuit are designed and fabricated in a 0.18µm CMOS process. Measurements of this new device under different biasing and illumination conditions show highly promising properties in terms of linearity, internal gain, and noise performances.