We present advanced techniques for the restoration of images obtained by soft x-ray laser microscopy. We show two methods. One method is based on adaptive thresholding, while the other uses local Wiener filtering in the wavelet domain to achieve high noise gains. These wavelet based denoising techniques are improved using spatial noise modeling. The accurate noise model is built up from two consecutive images of the object and respective background images. To our knowledge, the results of both proposed approaches over-perform competitive methods. The analysis is robust to enable image acquisition with significantly lower exposure times, which is critical in samples that are sensitive to radiation damage as is the case of biological samples imaged by SXR microscopy.