Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy

Andrew R Davis; Lorelle N Pye; Noam Katz; Janice A Hudgings; Kenneth R Carter

doi:10.1002/adma.201400859

Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy

Adv Mater. 2014 Jul 9;26(26):4539-45. doi: 10.1002/adma.201400859. Epub 2014 May 30.

Authors

Andrew R Davis¹, Lorelle N Pye, Noam Katz, Janice A Hudgings, Kenneth R Carter

Affiliation

¹ Department of Polymer Science and Engineering, University of Massachusetts Amherst, 120 Governors Dr., Amherst, MA, 01003, USA.

PMID: 24889350
DOI: 10.1002/adma.201400859

Abstract

Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric to asymmetrically saturated as the devices are increasingly biased. Furthermore, physical, chemical, and electrical defects are spatially resolved in cases where their presence is not obvious from the device performance.

Keywords: conjugated polymers; imaging; modulation spectroscopy.

Publication types

Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.