Note: application of a pixel-array area detector to simultaneous single crystal X-ray diffraction and X-ray absorption spectroscopy measurements

Cheng-Jun Sun; Bangmin Zhang; Dale L Brewe; Jing-Sheng Chen; G M Chow; T Venkatesan; Steve M Heald

doi:10.1063/1.4871055

Note: application of a pixel-array area detector to simultaneous single crystal X-ray diffraction and X-ray absorption spectroscopy measurements

Rev Sci Instrum. 2014 Apr;85(4):046109. doi: 10.1063/1.4871055.

Authors

Cheng-Jun Sun¹, Bangmin Zhang¹, Dale L Brewe¹, Jing-Sheng Chen², G M Chow², T Venkatesan³, Steve M Heald¹

Affiliations

¹ Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
² Department of Materials Science and Engineering, National University of Singapore, 117575 Singapore.
³ NUSNNI-Nanocore, National University of Singapore, 117411 Singapore.

PMID: 24784687
DOI: 10.1063/1.4871055

Abstract

X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) are two main x-ray techniques in synchrotron radiation facilities. In this Note, we present an experimental setup capable of performing simultaneous XRD and XAS measurements by the application of a pixel-array area detector. For XRD, the momentum transfer in specular diffraction was measured by scanning the X-ray energy with fixed incoming and outgoing x-ray angles. By selecting a small fixed region of the detector to collect the XRD signal, the rest of the area was available for collecting the x-ray fluorescence for XAS measurements. The simultaneous measurement of XRD and X-ray absorption near edge structure for Pr0.67Sr0.33MnO3 film was demonstrated as a proof of principle for future time-resolved pump-probe measurements. A static sample makes it easy to maintain an accurate overlap of the X-ray spot and laser pump beam.