Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments

Takashi Kameshima; Shun Ono; Togo Kudo; Kyosuke Ozaki; Yoichi Kirihara; Kazuo Kobayashi; Yuichi Inubushi; Makina Yabashi; Toshio Horigome; Andrew Holland; Karen Holland; David Burt; Hajime Murao; Takaki Hatsui

doi:10.1063/1.4867668

Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments

Rev Sci Instrum. 2014 Mar;85(3):033110. doi: 10.1063/1.4867668.

Authors

Affiliations

¹ JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
² RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.
³ Institute for Molecular Science, Myodaiji, Okazaki 444-8585, Japan.
⁴ XCam, Ltd, 2 Stone Circle Road, Round Spinney Industrial Estate, Northampton NN3 8RF, United Kingdom.
⁵ e2v, 106 Waterhouse Lane, Chelmsford, Essex CM1 2QU, United Kingdom.
⁶ Meisei Electric Co. Ltd, Naganuma 2223, Isesaki, Gunma 372-8585, Japan.

PMID: 24689567
DOI: 10.1063/1.4867668

Abstract

This paper presents development of an X-ray pixel detector with a multi-port charge-coupled device (MPCCD) for X-ray Free-Electron laser experiments. The fabrication process of the CCD was selected based on the X-ray radiation hardness against the estimated annual dose of 1.6 × 10(14) photon/mm(2). The sensor device was optimized by maximizing the full well capacity as high as 5 Me- within 50 μm square pixels while keeping the single photon detection capability for X-ray photons higher than 6 keV and a readout speed of 60 frames/s. The system development also included a detector system for the MPCCD sensor. This paper summarizes the performance, calibration methods, and operation status.