Modeling of temperature and excitation dependences of efficiency in an InGaN light-emitting diode

Opt Express. 2014 Jan 27;22(2):1413-25. doi: 10.1364/OE.22.001413.

Abstract

The changes in excitation dependence of efficiency with temperature are modeled for a wurtzite InGaN light-emitting diode. The model incorporates bandstructure changes with carrier density because of screening of quantum-confined Stark effect. Bandstructure is computed by solving Poisson and k · p equations in the envelope approximation. The information is used in a dynamical model for populations in momentum-resolved electron and hole states. Application of the approach shows the interplay of quantum-well and barrier emissions giving rise to shape changes in efficiency versus current density with changing temperature, as observed in some experiments.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.