Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

Hiroyuki Kishimoto; Yuya Shinohara; Yoshio Suzuki; Akihisa Takeuchi; Naoto Yagi; Yoshiyuki Amemiya

doi:10.1107/S1600577513023205

Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

J Synchrotron Radiat. 2014 Jan;21(Pt 1):1-4. doi: 10.1107/S1600577513023205. Epub 2013 Nov 2.

Authors

Hiroyuki Kishimoto¹, Yuya Shinohara², Yoshio Suzuki³, Akihisa Takeuchi³, Naoto Yagi³, Yoshiyuki Amemiya²

Affiliations

¹ Materials Research and Developments HQS, Sumitomo Rubber Industries Ltd, 2-1-1 Tsutsui, Chuo, Kobe, Hyogo 651-0071, Japan.
² Department of Advanced Materials Science, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan.
³ Research and Utilization Division, Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan.

Abstract

A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 µm(-1) was thereby achieved at an X-ray energy of 8 keV.

Keywords: hierarchical structures; nanocomposites; ultra-small-angle X-ray scattering.