Fabrication and characterization of improved Ag/PS hollow-glass waveguides for THz transmission

Appl Opt. 2013 Sep 20;52(27):6703-9. doi: 10.1364/AO.52.006703.

Abstract

This study involves the fabrication and characterization of improved quality silver (Ag)/polystyrene (PS) thin-film-coated hollow-glass waveguides for the low-loss transmission of terahertz radiation via modified dynamic liquid phase deposition techniques. High-quality PS thin films were deposited from aqueous PS solutions, and the spectral response of fabricated samples was measured from λ=1-100 μm. Fabricated samples exhibited highly defined spectral responses throughout this entire range indicative of PS films of excellent quality. The spectra of experimental samples were compared to the theoretical and bulk PS spectra in the near-IR and far-IR regions. The thickness of deposited PS thin films was found to depend on total sample length and to vary from approximately 10-16 μm for sample lengths ranging from 115 to 140 cm. Such PS film thicknesses are adequate for low-loss delivery from approximately 2-4 THz. Furthermore, film thickness was found to vary minimally along the waveguide length regardless of total sample length.