Even low power reactors, such as zero power reactors, are sufficient for semiconductor radiation hardness effect investigation. This reflects the fact that fluxes necessary for affecting semiconductor electrical resistance are much lower than fluxes necessary to affect material parameters. The paper aims to describe the irradiation possibilities of the LR-0 reactor with a special core arrangement corresponding to VVER-1000 dosimetry Mock-Up.
Keywords: LR-0; Neutron spectroscopy; Sample irradiation; VVER-1000.
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