Quantitative EDXS analysis of organic materials using the ζ-factor method

Stefanie Fladischer; Werner Grogger

doi:10.1016/j.ultramic.2013.07.015

Quantitative EDXS analysis of organic materials using the ζ-factor method

Ultramicroscopy. 2014 Jan:136:26-30. doi: 10.1016/j.ultramic.2013.07.015. Epub 2013 Jul 25.

Authors

Stefanie Fladischer¹, Werner Grogger

Affiliation

¹ Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology & Graz Centre for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria. Electronic address: stefanie.fladischer@felmi-zfe.at.

PMID: 24012932
DOI: 10.1016/j.ultramic.2013.07.015

Abstract

In this study we successfully applied the ζ-factor method to perform quantitative X-ray analysis of organic thin films consisting of light elements. With its ability to intrinsically correct for X-ray absorption, this method significantly improved the quality of the quantification as well as the accuracy of the results compared to conventional techniques in particular regarding the quantification of light elements. We describe in detail the process of determining sensitivity factors (ζ-factors) using a single standard specimen and the involved parameter optimization for the estimation of ζ-factors for elements not contained in the standard. The ζ-factor method was then applied to perform quantitative analysis of organic semiconducting materials frequently used in organic electronics. Finally, the results were verified and discussed concerning validity and accuracy.

Keywords: CuPc; Light-element analysis; Organic material; PTCBi; Quantitative EDXS analysis; ζ-factor method.

Publication types

Research Support, Non-U.S. Gov't