X-ray phase imaging with a laboratory source using selective reflection from a mirror

Opt Express. 2013 Apr 22;21(8):9308-14. doi: 10.1364/OE.21.009308.

Abstract

A novel approach for hard x-ray phase contrast imaging with a laboratory source is reported. The technique is based on total external reflection from the edge of a mirror, aligned to intercept only half of the incident beam. The mirror edge thus produces two beams. The refraction x-rays undergo when interacting with a sample placed before the mirror, causes relative intensity variations between direct and reflected beams. Quantitative phase contrast and pure absorption imaging are demonstrated using this method.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Equipment Design
  • Equipment Failure Analysis
  • Lenses*
  • Refractometry / instrumentation*
  • X-Ray Diffraction / instrumentation*