Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

Katerina Stamataki; Vassilis Papadakis; Michael A Everest; Stelios Tzortzakis; Benoit Loppinet; T Peter Rakitzis

doi:10.1364/AO.52.001086

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

Appl Opt. 2013 Feb 10;52(5):1086-93. doi: 10.1364/AO.52.001086.

Authors

Katerina Stamataki¹, Vassilis Papadakis, Michael A Everest, Stelios Tzortzakis, Benoit Loppinet, T Peter Rakitzis

Affiliation

¹ Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, Heraklion-Crete 71110, Greece.

PMID: 23400071
DOI: 10.1364/AO.52.001086

Abstract

We monitor the adsorption of Rhodamine 800, and the sedimentation of a polytetrafluoroethylene (PTFE) suspension at the surface of a fused-silica prism, by measuring both the absorption and s-p phase shift Δ of a 740 nm probe laser beam, using evanescent-wave cavity ringdown ellipsometry (EW-CRDE). The two systems demonstrate the complementary strengths of EW-CRDE, as the progress of adsorption of the Rhodamine 800 dye can only be observed sensitively via the measurement of absorption, whereas the progress of sedimentation of PTFE can only be observed sensitively via the measurement of Δ. We show that EW-CRDE provides a sensitive method for the measurement of Δ and demonstrates precision in Δ of about 10(-4) deg.