Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends

Li-Ting Lee; Shinzaburo Ito; Hiroaki Benten; Hideo Ohkita; Daisuke Mori

doi:10.1007/s13280-012-0269-2

Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends

Ambio. 2012;41 Suppl 2(Suppl 2):135-7. doi: 10.1007/s13280-012-0269-2.

Authors

Li-Ting Lee¹, Shinzaburo Ito, Hiroaki Benten, Hideo Ohkita, Daisuke Mori

Affiliation

¹ Department of Material Science and Engineering, Feng Chia University, Taiwan. ltlee@fcu.edu.tw

Abstract

A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Microscopy, Atomic Force*
Polymers / chemistry*
Solar Energy*
Thiophenes / chemistry

Substances

Polymers
Thiophenes
poly(3-hexylthiophene)