Phase in nanooptics

P Scott Carney; Bradley Deutsch; Alexander A Govyadinov; Rainer Hillenbrand

doi:10.1021/nn205008y

Phase in nanooptics

ACS Nano. 2012 Jan 24;6(1):8-12. doi: 10.1021/nn205008y. Epub 2012 Jan 3.

Authors

P Scott Carney¹, Bradley Deutsch, Alexander A Govyadinov, Rainer Hillenbrand

Affiliation

¹ Department Electrical and Computer Engineering and The Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois 61801, USA. carney@uiuc.edu

PMID: 22214211
DOI: 10.1021/nn205008y

Abstract

Quantitative phase measurements in imaging, microscopy, and nanooptics provide information not carried in amplitude measurements alone. In this issue of ACS Nano, Honigstein et al. present a new method in phase measurement. In this Perspective, we comment on this work and more broadly on the emerging role of phase and phase measurements in nanooptics.

Publication types

Research Support, Non-U.S. Gov't
Comment

MeSH terms

Artifacts*
Crystallography / methods*
Image Interpretation, Computer-Assisted / methods*
Imaging, Three-Dimensional / methods*
Microscopy, Scanning Probe / methods*
Nanoparticles / ultrastructure*