Conduction mechanisms and environmental sensitivity of solution-processed silicon nanoparticle layers for thin-film transistors
Small
.
2011 Oct 17;7(20):2853-7.
doi: 10.1002/smll.201100703.
Epub 2011 Aug 22.
Authors
Sebastian Weis
1
,
Richard Körmer
,
Michael P M Jank
,
Martin Lemberger
,
Michael Otto
,
Heiner Ryssel
,
Wolfgang Peukert
,
Lothar Frey
Affiliation
1
University of Erlangen-Nuremberg, Cauerstrasse 6, Erlangen, Germany.
PMID:
21866578
DOI:
10.1002/smll.201100703
No abstract available
Publication types
Research Support, Non-U.S. Gov't
MeSH terms
Microscopy, Electron, Scanning
Nanoparticles / chemistry*
Nanoparticles / ultrastructure
Nanotechnology / methods*
Silicon / chemistry*
Transistors, Electronic*
Substances
Silicon