Refractive index spectral dependence, Raman spectra, and transmission spectra of high-purity 28Si, 29Si, 30Si, and natSi single crystals

Victor G Plotnichenko; Vitaly O Nazaryants; Elena B Kryukova; Vasily V Koltashev; Vyacheslav O Sokolov; Anatoly V Gusev; Vladimir A Gavva; Tatiana V Kotereva; Mikhail F Churbanov; Eugeny M Dianov

doi:10.1364/AO.50.004633

Refractive index spectral dependence, Raman spectra, and transmission spectra of high-purity 28Si, 29Si, 30Si, and natSi single crystals

Appl Opt. 2011 Aug 10;50(23):4633-41. doi: 10.1364/AO.50.004633.

Authors

Victor G Plotnichenko¹, Vitaly O Nazaryants, Elena B Kryukova, Vasily V Koltashev, Vyacheslav O Sokolov, Anatoly V Gusev, Vladimir A Gavva, Tatiana V Kotereva, Mikhail F Churbanov, Eugeny M Dianov

Affiliation

¹ Fiber Optics Research Center, Russian Academy of Sciences, Moscow, Russia. victor@fo.gpi.ac.ru

PMID: 21833141
DOI: 10.1364/AO.50.004633

Abstract

We performed precise measurement of the refractive index of stable silicon isotopes 28Si, 29Si, and 30Si single crystals with enrichments above 99.9 at.% and a silicon single-crystal natSi of natural isotopic composition with the Fourier-transform interference refractometry method from 1.06 to more than 80 μm with 0.1 cm(-1) resolution and accuracy of 2×10(-5)…1×10(-4). The oxygen and carbon concentrations in all crystals are within 5×10(15) cm(-3), and the content of the metal impurities is 10(-5)…10(-6) at.%. The peculiar changes of the refractive index in the phonon absorption region of all silicon single crystals are shown. The coefficients of the generalized Cauchy dispersion function approximating the experimental refractive index values all over the measuring range are given. The transmission and Raman spectra are also studied.