High-precision metrology of highly charged ions via relativistic resonance fluorescence

Phys Rev Lett. 2011 Jan 21;106(3):033001. doi: 10.1103/PhysRevLett.106.033001. Epub 2011 Jan 18.

Abstract

Resonance fluorescence of laser-driven highly charged ions is investigated with regard to precisely measuring atomic properties. For this purpose an ab initio approach based on the Dirac equation is employed that allows for studying relativistic ions. These systems provide a sensitive means to test correlated relativistic dynamics, quantum electrodynamic phenomena and nuclear effects by applying x-ray lasers. We show how the narrowing of sidebands in the x-ray fluorescence spectrum by interference due to an additional optical driving can be exploited to determine atomic dipole or multipole moments to unprecedented accuracy.