Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals

R Ciancio; H Pettersson; R Fittipaldi; A Kalabukhov; P Orgiani; A Vecchione; Y Maeno; S Pace; E Olsson

doi:10.1016/j.micron.2010.03.012

Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals

Micron. 2011 Jun;42(4):324-9. doi: 10.1016/j.micron.2010.03.012. Epub 2010 Sep 17.

Authors

R Ciancio¹, H Pettersson², R Fittipaldi³, A Kalabukhov⁴, P Orgiani⁵, A Vecchione³, Y Maeno⁶, S Pace³, E Olsson²

Affiliations

¹ CNR-SPIN and Department of Physics "E.R. Caianiello", University of Salerno, I-84081 Baronissi (SA), Italy; Department of Applied Physics, Microscopy and Microanalysis, Chalmers University of Technology, SE-41296 GÄoteborg, Sweden; CNR-IOM, TASC Laboratory, Area Science Park - Basovizza, I-34149 Trieste, Italy.
² Department of Applied Physics, Microscopy and Microanalysis, Chalmers University of Technology, SE-41296 GÄoteborg, Sweden.
³ CNR-SPIN and Department of Physics "E.R. Caianiello", University of Salerno, I-84081 Baronissi (SA), Italy.
⁴ Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 GÄoteborg, Sweden.
⁵ CNR-SPIN, I-84081 Baronissi (SA), Italy.
⁶ Department of Physics, Graduate School of Science, Kyoto University, Kyoto 606-8502, Japan.

PMID: 20943407
DOI: 10.1016/j.micron.2010.03.012

Abstract

Sr3Ru2O7/Sr2RuO4 eutectic system is investigated by electron backscattering diffraction (EBSD) and X-ray diffraction (XRD). The eutectic growth enables the solidification of the two phases in an ordered lamellar pattern extending along the growth direction, namely the b-axis direction. The eutectic material thus provides in the a-c plane two distinct interfaces having different microstructures with respect to the growth direction. Our analysis shows that, across the inplane c-axis direction (characterized by a poor lattice matching), the b-axis orientation is not constant at the individual interfaces, showing an orientation spread of about 5°. However, across the in-plane a-axis direction (characterized by a good lattice matching), the b-axis orientation does not change within a few tenths of degree (about 0.25°). Such information at nanoscale is also verified on a macroscopic level by standard XRD investigation.

Publication types

Research Support, Non-U.S. Gov't